ttp (trans tech publications inc.) eBooks

Papers of Title

Ultra Clean Processing of Silicon Surfaces VI

Table of Contents (72 papers, 10 per page listed)


Selective Wet Etching of High-k Gate Dielectrics   download PDF
Kurt K. Christenson, Brent Schwab, Thomas J. Wagener, Bruce Rosengren, Deborah J. Riley, Joel Barnett
p129
Investigation of Particle Removal from Silicon Surfaces by Means of Dry and Steam Laser Cleaning   download PDF
P. Leiderer, M. Mosbacher, J. Boneberg, C. Bartels, F. Lang, Conrado R.M. Afonso, D. Baeuerle
p133
A Comprehensive Model for Cleaning Semiconductor Wafers   download PDF
Gretchen Burdick, Sean Eichenlaub, Neil Berman, Stephen Beaudoin
p135
Effect of Transient pH on Particle Deposition during Immersion Rinsing   download PDF
Wim Fyen, Kai Dong Xu, Rita Vos, Guy Vereecke, Paul W. Mertens, Marc M. Heyns
p139
Influence of Hardware and Chemistry on the Removal of Nano-Particles in a Megasonic Cleaning Tank   download PDF
Guy Vereecke, Marc M. Heyns, Rita Vos, Frank Holsteyns, M. Schmidt, M. Baeyens, S. Gomme, James Snow, Paul W. Mertens, V. Coenen, T. Bauer
p143
Influence of Frequency on the Removal Efficiency of Nano-Particles in a Megasonic Spray Cleaning Tool   download PDF
M. Schmidt, Guy Vereecke, Rita Vos, Frank Holsteyns, M. Baeyens, Paul W. Mertens
p147
A Theoretical and Experimental Study of Damage-Free BEOL Cleaning with Megasonic Agitation   download PDF
Jeffrey M. Lauerhaas, Yi Wu, Mario Bran, Brian Fraser, Eric Brause, Tom Nicolosi
p151
Removal of Small (<100-nm) Particles and Metal Contamination in Single-Wafer Cleaning Tool   download PDF
Atsuro Eitoku, James Snow, Rita Vos, M. Sato, S. Hirae, Kazuo Nakajima, M. Nonomura, M. Imai, Paul W. Mertens, Marc M. Heyns
p157
Relation between Particle Density and Haze on a Wafer: a New Approach to Measuring Nano-Sized Particles   download PDF
Kai Dong Xu, Rita Vos, Guy Vereecke, Marcel Lux, Wim Fyen, Frank Holsteyns, Karine Kenis, Marc M. Heyns, Paul W. Mertens, Chris Vinckier
p161
TXRF Analysis of Low Z Elements and TXRF-NEXAFS Speciation of Organic Contaminants on Silicon Wafer Surfaces Excited by Monochromatized Undulator Radiation   download PDF
Burkhard Beckhoff, R. Fliegauf, Gerhard Ulm, J. Weser, G. Pepponi, C. Streli, P. Wobrauschek, T. Ehmann, L. Fabry, S. Pahlke, B. Kanngießer, W. Malzer
p165