Excitonic Emission from High-Quality Homoepitaxial Diamond Film
Hideyuki Watanabe, Takashi Sekiguchi, Hideyo Okushi |
p165 |
|
Defect Characteristics in Sulfur-Implanted CVD Homoepitaxial Diamond
Mitsuru Hasegawa, M. Ogura, Daisuke Takeuchi, Sadanori Yamanaka, Hideyuki Watanabe, Shien Ri, Naoto Kobayashi, Hideyo Okushi, Takashi Sekiguchi |
p171 |
|
Scanning Probe Field Emission Current Measurements on Polycrystalline Diamond Films
H. Wakimoto, H. Tomokage, Young Do Kim, W. Choi, Y. Iseri, T. Ando |
p177 |
|
Surface Characterization of Plasma Etched DLC Films by Scanning Tunneling Microscopy and Atomic Force Microscopy
E.R. Hwang, W. Choi, Y. Iseri, H. Tomokage |
p183 |
|
Field Emission Characteristics of Plasma Enhanced Chemical Vapor Deposited Diamond-Like Carbon Films Using Scanning Probe Measurements
W. Choi, E.R. Hwang, N. Nomura, S. Itose, Y. Iseri, T. Ando, Young Do Kim, H. Tomokage |
p191 |
|
Defects Analysis of Diamond Films in Cross Section Using Cathodoluminescence and High-Resolution Transmission Electron Microscopy
Daisuke Takeuchi, Hideyuki Watanabe, Sadanori Yamanaka, Hidetaka Sawada, Hideki Ichinose, Takashi Sekiguchi, Hideyo Okushi |
p197 |
|
Radiation Induced Lattice Defects in n-MOSFETs and Their Effects on Device Performance
K. Kobayashi, H. Ohyama, Masashi Nakabayashi, Eddy Simoen, C. Claeys, Y. Takami, M. Yoneoka, K. Hayama, S. Kohiki |
p205 |
|
MC-IR-LST and TEM Combined Analysis of Defects in the OSF-Ring of Cz-Silicon Crystals
C. Frigeri, M. Ma, T. Irisawa, Tomoya Ogawa |
p211 |
|
An In-Situ Observation of Dislocations and Crystal-Melt Interface during the Melting of Silicon
Yuren Wang, Koichi Kakimoto |
p217 |
|
Negative Photoconductivity in Polycrystalline Silicon Films Doped with Phosphorus
Masashi Nakabayashi, H. Ohyama, Eddy Simoen, M. Ikegami, C. Claeys, K. Kobayashi, M. Yoneoka, Y. Takami, H. Sunaga, H. Takizawa, K. Miyahara |
p225 |
