Highly Doped Microcrystalline SiGe Films: Structure and Transport Properties
F. Edelman, T. Raz, Y. Komem, M. Stölzer, P. Zaumseil |
p149 |
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Photoluminescence Measurements of Microcrystalline Silicon
M. Meister, Joerg Weber, M. Furtsch, H. Muenzel |
p155 |
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Silicon Produced by Thermal Chemical Vapour Deposition on Ceramic Substrates for Photovoltaic Applications
A.J.M.M. Van Zutphen, A. Von Keitz, M. Zeman, J.W. Metselaar |
p161 |
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Grain Matrix Made with Excimer-Laser Crystallization of Thin Silicon Films
P.Ch. Van der Wilt, Ryoichi Ishihara |
p169 |
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Grain Boundary Location Control by Patterned Metal Film in Excimer Laser Crystallized Polysilicon
L. Mariucci, R. Carluccio, A. Pecora, G. Fortunato, F. Massussi, V. Foglietti, D. Della Sala, J. Stoemenos |
p175 |
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Characterisation of Excimer Laser Crystallised Polysilicon by X-Ray Diffraction and by Channeling Contrast in a Scanning Electron Microscope
S. Loreti, M. Vittori, L. Mariucci, G. Fortunato |
p181 |
|
Multicrystalline Silicon Thin Films: Laser Crystallization Conditions and Properties
G. Andrä, J. Bergmann, Fritz Falk, E. Ose, N.D. Sinh |
p187 |
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Laser-Crystallized Polycrystalline Silicon on Glass for Photovoltaic Applications
R. Dassow, J.R. Köhler, M. Grauvogl, R.B. Bergmann, Jens Werner |
p193 |
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Properties of Poly-Si Obtained by Solid Phase Crystallization of Differently Produced a:Si:H Thin Films
M.L. Addonizio, P. Delli Veneri, G. Fameli, S. Loreti, C. Minarini, C. Privato, G. Sinno, E. Terzini, M. Vancini |
p199 |
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Transmission Electron Microscopy and Raman Analysis of the Crystallisation Process of a-Si on Glass for Low Seed Density
J.L. Alay, A. Vilà, J.M. Morante, T. Mohammed-Brahim, M. Sarret, O. Bonnaud |
p205 |
