Microdefects in Polycrystalline Silicon
M. Werner, Eicke R. Weber, Scott A. McHugo, K.L. Chapman |
p81 |
|
Investigations for the Detection of Microdefects in Cast Multicrystalline Silicon
E. Wolf, D. Klinger, S. Bergmann |
p87 |
|
Dislocation-Related Absorption, Photoluminescence and Birefringence in Deformed n-ZnSe Crystals
Yu.G. Shreter, Y.T. Rebane, O.V. Klyavin, P.S. Aplin, C.J. Axon, W.T. Young, John W. Steeds |
p93 |
|
Tight-Binding Total Energy Calculation for Fe, Co and Ni in Silicon
A. Hairie, F. Hairie, B. Lebouvier, Jin Ming Chen, E. Paumier, Gerard Nouet |
p99 |
|
Polycrystalline Semiconductors: Structure-Property Relationships
David A. Smith, C.S. Nichols |
p105 |
|
Influence of a Preliminary Phosphorus Diffusion on the Evaluation of the Recombination Strenght of Dislocations in Czochralski Silicon Wafers
Isabelle Périchaud, J.J. Simon |
p117 |
|
Reconstruction of the Recombination Centre Distribution in Dislocation Impurity Atmosphere in Si
I.E. Bondarenko, O.V. Kononchuk, V. Sirotkin |
p123 |
|
Transmission Electron Microscopy Studies of Lattice-Mismatched Semiconductor Heterostructures Used for Integrated Optoelectronic Devices
G. Patriarche |
p131 |
|
Electrical and Structural Properties of Solution Grown Silicon Layers on Polycrystalline Silicon Substrates
B. Steiner, Günter Wagner, Axel Voigt, W. Dorsch, Horst P. Strunk |
p143 |
|
Preparation of Low Temperature Polysilicon Films with SiH4 and SiF4 Gas Mixtures
H.S. Choi, K.H. Jang, Min Koo Han |
p149 |
