Desorption Energy of Oxygen Adsorbed on Un-Intentionally Doped Low Pressure Chemical Vapor Deposited Silicon Films
D. Mostefa, B. Fortin, F. Raoult, M. Sarret, G. Rossé, O. Bonnaud |
p151 |
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Segregation and Precipitation of Platinum Silicides in Si/SiO2 Interfaces and Dislocations
B. Laurent, Dominique Mangelinck, Bernard Pichaud, André Lhorte, J.B. Quoirin |
p157 |
|
Calculation of the Atomic and Electronic Structure of the {113} Planar Interstitial Defects in Silicon
Masanori Kohyama, S. Takeda |
p163 |
|
Local Grain Boundary Property Measurements
D.B. Holt |
p171 |
|
Local Investigation of the Electrical Properties of Grain Boundaries in Silicon
J. Palm, D. Steinbach, H. Alexander |
p183 |
|
Investigation of Minority Carrier Diffusion Length in Multicrystalline Silicon by Quantitative Electron Beam Induced Current Mapping
A. Barhdadi, S. Sivoththaman, M. Barbe, M. Rodot, J.L. Maurice |
p189 |
|
Minority Charge Carrier Trapping at Grain Boundaries Provided with a High Barrier Schottky Contact
C. Häßler, P. Bittner, Gerhard Pensl, M. Schulz |
p195 |
|
Electrical Transport in Polycrystalline Semiconductors
O. Ka |
p201 |
|
Origin of Curved Arrhenius Plots for the Conductivity of Polycrystalline Semiconductors
Jens Werner |
p213 |
|
Effect of Local Inhomogeneities on the Electrical Properties of Polycrystalline Silicon
Maurizio Acciarri, C. Savigni, Simona Binetti, Sergio Pizzini |
p219 |
