| ISBN-13: | 978-3-908044-07-9 |
|---|---|
| Year: | 1991 |
| Title: | Atomic Migration and Defects in Materials [online] |
| Authors/Editors: | D. Gupta, H. Jain and R.W. Siegel |
| Published in: |
Defect and Diffusion Forum, Volume 75
|
| Category: | Proceedings of the ASM Symposium on Atomic Migration and Defects in Materials, Indianapolis, USA, October 1989 |
| Pages: | 254 |
| Edition: | |
| Description: | The book covers various aspects of of diffusion: its fundamental nature, methodology of experimental and analytical techniques, and implications in modern technology. Emphasis is placed on superconducting oxides, nanocrystalline materials, crystalline semiconductors, multicomponent systems, grain boundaries, and amorphous metallic and semiconducting materials. |
| TOC: | Table of Contents |
| Prices: | USD: 160.00 / EUR: 116.00 |
