ttp (trans tech publications inc.) eBooks

Papers of Title

Silicon Carbide and Related Materials 2004

Table of Contents (253 papers, 10 per page listed)


2-Inch 4H-SiC Homoepitaxial Layer Grown on On-Axis C-Face Substrate by CVD Method   download PDF
Kazutoshi Kojima, Hajime Okumura, Satoshi Kuroda, Kazuo Arai, Akihiko Ohi, Hiroyuki Akinaga
p93
Investigation of Basal Plane Dislocations in the 4H-SiC Epilayers Grown on {0001} Substrates   download PDF
Hidekazu Tsuchida, Toshiyuki Miyanagi, Isaho Kamata, Tomonori Nakamura, Kunikaza Izumi, Koji Nakayama, R. Ishii, Katsunori Asano, Yoshitaka Sugawara
p97
Epitaxial Growth and Characterisation of Phosphorus Doped SiC Using TBP as Precursor   download PDF
Anne Henry, Erik Janzén
p101
Experimental Investigation and Simulation of Silicon Droplets Formation during SiC CVD Epitaxial Growth   download PDF
Galyna Melnychuck, Yaroslav Koshka, Michael S. Mazzola, Jeffery L. Wyatt
p105
Structural Improvement of Seeds for Bulk Crystal Growth by Using Hot-Wall CVD of 4H-SiC   download PDF
Günter Wagner, D. Schulz, J. Doerschel
p109
CVD Growth and Characterization of 4H-SiC Epitaxial Film on (11-20) As-Cut Substrates   download PDF
Ze Hong Zhang, Ying Gao, Arul Arjunan, Eugene Toupitsyn, Priyamvada Sadagopan, Robert M. Kennedy, Tangali S. Sudarshan
p113
Evaluation of p-Type Doping for (1,1,-2,0) Epitaxial Layers Grown on α-Cut (1,1,-2,0) 4H-SiC Substrates   download PDF
Caroline Blanc, Marcin Zielinski, Veronique Soulière, C. Sartel, Sandrine Juillaguet, Sylvie Contreras, Jean Camassel, Yves Monteil
p117
Aluminium Doping of 4H-SiC Grown with HexaMethylDiSilane   download PDF
C. Sartel, Veronique Soulière, Marcin Zielinski, Yves Monteil, Jean Camassel, S. Rushworth
p121
Is the Al Solubility Limit in SiC Temperature Dependent or not?   download PDF
Christophe Jacquier, Gabriel Ferro, Marcin Zielinski, Efstathios K. Polychroniadis, A. Andreadou, Jean Camassel, Yves Monteil
p125
Homoepitaxial Growth on 4H-SiC (03-38) Face by Sublimation Close Space Technique   download PDF
S. Yoneda, Tomoaki Furusho, H. Takagi, S. Ohta, Shigehiro Nishino
p129