Approximate Estimation of Contributions to Pure X-Ray Diffraction Line Profiles from Crystallite Shapes, Sizes and Strains by Analysing Peak Widths
Marek Andrzej Kojdecki |
p107 |
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Study of Submicrocrystalline Materials by Conventional Powder Diffraction and Diffuse Scattering in Transmitted Wave
Radomír Kužel, D. Šimek, J. Kub, Rinat K. Islamgaliev |
p111 |
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Thickness Determination of Thin Polycrystalline Films by Grazing Incidence X-Ray Diffraction
J. Lhotka, Radomír Kužel, G. Cappuccio, V. Valvoda |
p115 |
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XRD Line Broadening Analysis with Ball Milled Palladium
I. Lucks, P. Lamparter, Jian Xu, Eric J. Mittemeijer |
p119 |
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Line Broadening Analysis Using FullProf*: Determination of Microstructural Properties
Juan Rodríquez-Carvajal, T. Roisnel |
p123 |
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Line Profile Analysis (LPA) Methods: Systematic Ranking of the Quality of their Basic Assumptions
Arnold C. Vermeulen, Rob Delhez |
p127 |
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Applicability of the Crystallite Group Method to Fibre Textured Specimens
U. Welzel, Eric J. Mittemeijer |
p131 |
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Optimization of X-Ray Pole Figure Measurement
Leszek Tarkowski, L. Laskosz, Jan T. Bonarski |
p137 |
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Single Reflection Method for Pole-Density Measurements Accounting for Secondary Extinction in Textured Films
I. Tomov |
p141 |
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A Quantitative Basis for Rocking Curve Measurement of Highly Oriented Polycrystalline Thin Films
H. Toraya, H. Hibino, Takashi Ida |
p145 |
