Line Profile Analysis in the Rietveld Method and Whole-Powder-Pattern Fitting
Paolo Scardi, Yu Hui Dong, Matteo Leoni |
p132 |
|
Calculation of Diffraction Line Profiles for Structures with Dislocations
Jan-Dirk Kamminga, Rob Delhez |
p142 |
|
Peak-Shape Analysis Using the General Debye Equation
Yuri G. Andreev, Peter G. Bruce |
p148 |
|
Peculiarities of the X-Ray Powder Diffraction Patterns from FCC Crystals Containing a High Concentration of Random Deformation Stacking Faults
A.I. Ustinov, N.M. Storchak, L.O. Olikhovska |
p154 |
|
Structural Characteristics of Disordered Lamellar Structures: Interpretation of XRD and SAXS Patterns
H. Ben Rhaiem, A. Ben Haj Amara, C.H. Pons |
p160 |
|
Peak Shift Correction for Transparency in Classical XRD Residual Stress Methods
Arnold C. Vermeulen |
p166 |
|
General Newly-Discovered Regularities of Structure Inhomogeneity in Textured Metal Materials
Yuriy Perlovich, Margarita Isaenkova, Hans Joachim Bunge |
p174 |
|
The Fullest Description of the Structure of Textured Metal Materials with Generalized Pole Figures: the Example of Rolled Zr Alloys
Yuriy Perlovich, Margarita Isaenkova, Hans Joachim Bunge |
p180 |
|
Modeling the Texture Development of Two-Phase Composites by Considering Intra-Crystalline Misorientation
R. Bolmaro, Heinz Günter Brokmeier, A. Roatta, A.L. Fourty, M.A. Bertinetti, Javier Signorelli |
p186 |
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Anisotropy of Secondary Extinction Coefficient in Textured Films
I. Tomov |
p192 |
