X-Ray Diffraction Method of Grain Size Measurement
Yu.D. Yagodkin, G.V. Vekilova, R.S. Mungalov |
p133 |
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X-Ray Diffraction Characterization of Textured Films Accounting for Secondary Extinction
I. Tomov, V. Yamakov |
p137 |
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Proficiency Testing of Instruments - A Key Element for Quality Assurance in X-Ray Powder Diffraction Part 1: Matching the Effort to the Actual Needs
B. Peplinski, J. Wenzel |
p144 |
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An X-Ray Powder Diffraction Investigation of a Fine-Grained Synthetic α-Cordierite Powder
B. Peplinski, Ralf Müller, J. Wenzel, R. Sojref, Dietrich Schultze |
p150 |
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Application of Experimental Performance Criteria for Optimal Design of Angular Dispersive Powder Diffractometers
B. Grabcev, A. Tirziu |
p156 |
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Multicapillary Optics for Materials Science Studies
Paolo Scardi, Sergio Setti, Matteo Leoni |
p162 |
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Design Optimisation of a High-Temperature X-Ray Diffractometer for In-Situ Determination of Lattice Mismatch and Residual Stress - the Hotbird
F.M.A. Margaça, N.R. Pinhão, A.D. Sequeira |
p168 |
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Spatially Modulated Advanced X-Ray Optics
A. Erko |
p174 |
|
Application of Ni/C Göbel Mirrors
T. Holz, Reiner Dietsch, H. Mai, L. Brügemann |
p179 |
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Effect of Ion-Beam Polishing on the Interface Quality in a Ti/C Multilayer Mirror for 'Water Window'
Matej Jergel, V. Holý, E. Majková, Š. Luby, R. Senderák, H.J. Stock, D. Menke, U. Kleineberg, U. Heinzmann |
p184 |
