Passivation Studies of Se/GaAs Interface using X-Ray Photoelectron and Photoluminescence Spectroscopy
B.A. Kuruvilla, A. Datta, R.S. Kulkarni |
p171 |
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Passivation of GaAs with Sulphur Surface Treatment and UVCVD Silicon Nitride Cap Layer
H. Sik, J.L. Courant, B. Sermage |
p179 |
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Silicon Nitride and Oxide Deposited by Direct Photolysis on Sulfur Treated GaAs and InP: Application to III-V Passivation
N. Proust, Gérard Guillot, M. Petitjean, M. Beguet, J.F. Chapeaublanc, J. Perrin |
p185 |
|
Surface Passivation of III-V Compound Semiconductors with Chalcogen Atoms
H. Oigawa, H. Shigekawa, Y. Nannichi |
p191 |
|
Passivation of InP for Optoelectronics
H. Kräutle |
p199 |
|
Formation of Oxide Films on HgCdTe after Fluorine-Consist Rinsing
L. Romashko, A. Myasnikov, V.N. Ovsyuk, V. Vasilyev, T. Zemtsova |
p209 |
|
STM and AFM Studies of Passive Films
Philippe Marcus, Vincent Maurice |
p221 |
|
Disorder and Structural Relaxation in Passive Films on Fe-Cr Alloys
M.P. Ryan, Shinji Fujimoto, George E. Thompson, R.C. Newman |
p233 |
|
Atomic Structure and Mechanical Behaviour of Passive Film Formed on Stainless Steels
J.M. Olive, Vincent Vignal, D. Desjardins |
p241 |
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AFM Observations of the Breakdown Damage in Anodic T2O5 Films
I. Montero, J.M. Albella, L. Vázquez |
p251 |
