Laser Characterization of Semiconductors
M. Stutzmann |
p141 |
|
Silicon Surface Nonlinear Optics
C. Jordan, G. Marowsky, R. Buhleier, G. Lüpke, E.J. Canto-Said, Z. Gogolak, J. Kuhl |
p153 |
|
Mapping of Defect-Related Silicon Properties with the ELYMAT Technique in Three Dimensions
J. Carstensen, W. Lippik, H. Föll |
p159 |
|
Laser Examined AlGaAs-Solar Cells with Wide-Gap Tunneling-Thin Cap Layers
V.M. Andreev, V.P. Kvostikov, V.R. Larionov, V. Rumyantsev |
p165 |
|
Use of Photoinduced Microwave Reflection for the Non-Destructive Characterization of Solar Cell Materials and Device Structures
J.M. Borrego |
p171 |
|
Photothermal Deflection Spectroscopy on Amorphous Semiconductor Heterojunctions and Determination of the Interface Defect Densities
F. Becker, Reinhard Carius, J.-Th. Zettler, J. Klomfass, C. Walker, H. Wagner |
p177 |
|
Summary Abstract: Laser Surface Photovoltage Spectroscopy - A New Tool for Determination of Surface State Distributions and Properties
L. Kronik, L. Burstein, E. Fefer, M. Leibovitch, Y. Shapira |
p183 |
|
Photorefractive Two Wave Mixing and Steady State Photocarrier Gratings for Semiconductor Characterization
B. Smandek, Y. Ding, V. Hagemann, S. Gohlke, A. Wappelt, R. Wendt |
p185 |
|
A Novel Contactless Approach for Accurate Measurements of Electron-Hole Recombination Lifetime
G. Breglio, Antonello Cutolo, P. Spirito, L. Zeni |
p191 |
|
Raman Studies of Doped Poly-Si Thin Films Prepared by Pulsed Excimer Laser Annealing
A. Compaan, M.E. Savage, U. Jayamaha, T. Azfar, A. Aydinli |
p197 |
