An Inexpensive CCD Camera System for the Recording and On-Line Interpretation of TEM Kikuchi Patterns
Robert A. Schwarzer, Stefan Zaefferer |
p189 |
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On-Line Interpretation of SAD Channeling Patterns
Robert A. Schwarzer, Stefan Zaefferer |
p195 |
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Preparation of High-Resistance or Sensitive Samples for Grain Orientation Measurement with Electron Microscopes
Robert A. Schwarzer |
p201 |
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Equipment for Texture Measurement in Thin Films
Jerzy A. Szpunar, P. Blandford |
p207 |
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Application of the Method for Non-Destructive Evaluation of Texture Heterogeneity
Jacek Tarasiuk, Krzysztof Wierzbanowski, Andrzej Baczmański |
p213 |
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Influence of Texture on Backscattered Ultrasonic Noise
R. Bruce Thompson, K.Y. Han, I. Yalda-Mooshabad, J.H. Rose, F.J. Margetan |
p221 |
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Characterisation of Multilayers Crystallographic Texture
A. Tizliouine, J. Bessières, J.J. Heizmann, J.F. Bobo |
p227 |
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Determination of the Texture of a TiNi Shape Memory Alloy by Treatment of a Set of Overlapping Rays
A. Vadon, J.J. Heizmann, M. Chaoui |
p235 |
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On-Line Determination of Deformation Systems for Cubic and Hexagonal Materials with the TEM
Stefan Zaefferer, Robert A. Schwarzer |
p241 |
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On-line Interpretation of Spot and Kikuchi Patterns
Stefan Zaefferer, Robert A. Schwarzer |
p247 |
