New Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF Reproduction
G. Bermig, J. Tobisch, K. Richter, Kurt Helming |
p163 |
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Texture Analysis of Thin Films on Single Crystalline Substrates
H. Dittrich, G. Flik, H.U. Habermeier, Thomas Koehler, B. Leibold, M. Schuster |
p169 |
|
X-Ray Diffraction Method for Monitoring of Texture Evolution in Layers
I. Tomov |
p175 |
|
Texture Determination of PbZr0.53Ti0.47O3 Thin Films by XRD and BKDP
K.Z. Troost, A.J. Kinneging |
p181 |
|
The Ab-Initio Determination of Crystal Structures from their Powder Diffraction Patterns using a Combination of Entropy Maximisation and Likelihood Ranking
K. Shankland, C.J. Gilmore |
p189 |
|
Application of a Simulated Annealing Approach in Powder Crystal Structure Analysis
L.A. Solovyov, S.D. Kirik |
p195 |
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Determination of Molecular Crystal Structures from X-Ray Powder Diffraction Data
J.M. Amigó, L.E. Ochando, A. Charaї, R. Ballesteros, Jordi Rius |
p201 |
|
Ab Initio Determination of Molecular Crystal Structures using Powder Diffraction Data from a Laboratory X-Ray Source
P. Lightfood, M.J. Tremayne, Kenneth D.M. Harris, C. Glidewell, K. Shankland, C.J. Gilmore, Peter G. Bruce |
p207 |
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Application of X-Ray Powder Diffraction for the Investigation of Polytype Structures in Metals and Alloys
B.I. Nikolin |
p213 |
|
Diffraction from Thin Layers
P.F. Fewster, N.L. Andrew |
p221 |
