Water Molecule Sensitive Layers Deposited from Hexamethyldisiloxane/Oxygen Mixture at Low Temperature
N. Guermat, A. Bellel, Salah Sahli, Y. Segui, Patrice Raynaud
|
p69 |
Synthesis and Characterization of New Chelating Resin Functionalized with Pyrocatechol Violet and its Application as Extractant for Zinc (II)
T. Belaid, S. Aitali, M. Benamor, K. Belhamel
|
p75 |
Effects of Hydrogen Partial Pressure on Boron-Doped Hydrogenated Amorphous Silicon (a-Si:H(B)) Properties
N. Khelifati, R. Cherfi, A. Keffous, A. Rahal, M. Kechouane
|
p81 |
Structural Properties of Al-Cu Thin Films after Heat Treatment
S. Lallouche, M.Y. Debili
|
p87 |
Comparative Study between Two Polymers of Arylene-Vinylene Units: Electrochemical, Spectroscopic Characterization and Resistivity Measurements
S. Mosbah, I. Zbiri, L. Bencharif
|
p95 |
Space Resolved Optical Emission Spectroscopy During Deposition of BaxSr1-xTiO3 Thin Films by Double Hollow Cathode Plasma Jet System
J. Olejníček, Zdenek Hubička, M. Čada, P. Virostko, Štepan Kment, P. Adámek, Lubomir Jastrabík, A. Dejneka
|
p105 |
Photoluminescence and Structural Properties of ZnO Films Deposited on Si Substrates by Chemical Spray Deposition
Samira Sali, R. Tala-Ighil, S. Kermadi, M. Boumaour, M. Kechouane
|
p111 |
Deposition of Titanium Nitride Thin Films onto Silicon by RF Reactive Magnetron Sputtering
Nadia Saoula, K. Henda, R. Kesri
|
p117 |
Investigation of Deep Interface Traps in Very-Thin Oxide/Si Structures Prepared at Low Temperatures Using Chemical Solutions
Jaroslav Rusnák, Michal Ružinský, Kentaro Imamura, Taketoshi Matsumoto, Miloslav Štefečka, Masao Takahashi, Hikaru Kobayashi, Emil Pinčík
|
p123 |
Correlation between Physicochemical and Electrical Properties of Hydrogenated Amorphous Silicon Doped with Boron: Effect of Thermal Annealing
H.Y. Seba, R. Cherfi, Farida Hamadache, M. Aoucher
|
p129 |