Advanced Measurement and Test X

Advanced Measurement and Test X
ISBN-13:

978-0-87849-271-8

Authors / Editors:

Yanwen Wu

Category:

Selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), P.R. China

Pages:

1730

Year:

2010

Edition:

softcover, 2-vol. set

TOC:
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Description:

This special collection on Advanced Measurement and Test is dedicated to the electronic testing of devices, boards and systems and covers the complete cycle: from design verification, design-for-testing, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement. Design, testing and yield professionals were invited to confront the challenges which the industry faces, and to learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers and test engineers. read more...

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