EBSD-Based Dislocation Microscopy
Brent L. Adams, Calvin J. Gardner, David T. Fullwood
|
p3 |
Calculation Methods to Determine Crystallographic Elements: Interface Plane, Surfaces Plane and Twinning Elements, Based on Electron Diffraction Orientation Measurements by SEM and TEM
Claude Esling, Yu Dong Zhang, Jacques Muller, Xiang Zhao, Liang Zuo
|
p11 |
Two- and Three-Dimensional EBSD Measurement of Dislocation Density in Deformed Structures
David P. Field, Colin C. Merriman, Ioannis N. Mastorakos
|
p17 |
Texture Control in Non-Oriented Electrical Steels by Severe Plastic Deformation
Leo A.I. Kestens, Roumen H. Petrov, Patricia Gobernado, Elke Leunis
|
p23 |
Texture versus Residual Deformation Effects in Metal Materials: Principles of Experimental Approach and General Regularities
Yuriy Perlovich, Margarita Isaenkova, Vladimir Fesenko
|
p31 |
Application of Electron Backscatter Diffraction to Grain Boundaries
Valerie Randle
|
p39 |
Texture Heterogeneity in ECAP Deformed Copper
Werner Skrotzki, Christine Tränkner, Robert Chulist, Benoît Beausir, Satyam Suwas, László S. Tóth
|
p47 |
Development of a 3D Crystal Plasticity Model that Tracks Dislocation Density Evolution
Alankar Alankar, Ioannis N. Mastorakos, David P. Field
|
p57 |
Texture Analysis with MTEX – Free and Open Source Software Toolbox
F. Bachmann, Ralf Hielscher, Helmut Schaeben
|
p63 |
Structure Stability and Magnetic Properties of Ni2XGa (X = Mn, Fe, Co) Ferromagnetic Shape Memory Alloys by DFT Approach
Jing Bai, Jean Marc Raulot, Claude Esling, Xiang Zhao, Liang Zuo
|
p69 |