Defect Analysis in Semiconductor Materials Based on p-n Junction Diode Characteristics
Eddy Simoen, C. Claeys, Jan Vanhellemont
|
p1 |
Surface Microrelief Transformation Induced by Laser during Thin Al Film Growth on the (001) GaAs by the CBE Method
Dmitri V. Lioubtchenko, Tatiana A. Briantseva, I.A. Markov, Tim J. Bullough
|
p25 |
Local Vibrational Modes of Zn-H-P in GaP, InP and ZnTe
Vitor J.B. Torres, J. Coutinho, Patrick R. Briddon
|
p31 |
Electronic structure and doping effect of Ni and Co in the kink on the edge dislocation of bcc iron
Li Qun Chen, Zheng Chen Qiu
|
p37 |
Modeling of Diffusion Saturation of Titanium by Interstitial Elements under Rarefied Atmospheres
Ya. Matychak, V. Fedirko, A. Prytula, I. Pohreljuk
|
p47 |
Positron Lifetime in Deformed AlSi10.9Mg0.17Sr0.06 Alloys
M.A. Abdel-Rahman, M.S. Abdallah, Emad A. Badawi
|
p55 |
Peculiarities of Discontinuous Precipitation in the Pb-Sn Alloy
Yu.A. Lyashenko, N.V. Zaitzeva, O.A. Shmatko
|
p61 |
Direct Force Controversy in Electromigration Exit
A. Lodder
|
p77 |
Low Temperature Self-Diffusion of Iron in the 56Fe/57Fe Stable-Isotope Thin-Film System
M. Vasylyev, Sergey I. Sidorenko, S.M. Voloshko, V. Kostiuchenko, I.E. Kotenko
|
p85 |
Investigations of the axial displacements of Co2+and Ni3+ in Al2O3
Shao Yi Wu, Qiang Fu, Guang Duo Lu, Jin Song Yao
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p93 |