Intrinsic Point Defects in Silicon: a Unified View from Crystal Growth, Wafer Processing and Metal Diffusion
Vladimir V. Voronkov, Robert J. Falster |
p1 |
|
Precipitation Enhancement of "so Called" Defect-Free Czochralski Silicon Material
Timo Müller, G. Kissinger, P. Krottenthaler, C. Seuring, R. Wahlich, Wilfried von Ammon |
p11 |
|
Oxygen Precipitation in Nitrogen Doped CZ Silicon
G. Kissinger, Timo Müller, Andreas Sattler, W. Häckl, M. Weber, U. Lambert, A. Huber, P. Krottenthaler, Hans Richter, Wilfried von Ammon |
p17 |
|
From Continuous to Quantized Charging Phenomena in Few Nanocrystals MOS Structures
G. Benassayag, M. Shalchian, Jeremie Grisolia, C. Bonafos, S.M. Atarodi, A. Claverie |
p25 |
|
Passivation of Ge Nanocrystals in SiO2
Jesper Skov Jensen, Tom P. Leervad Pedersen, Rui Pereira, Pia Bomholt, Jacques Chevallier, Ole Hansen, Arne Nylandsted Larsen, Brian Bech Nielsen |
p33 |
|
The Properties of Hydrostatically Strained Ge and Si Nanocrystals in Silicon Dioxide Matrix
I.E. Tyschenko, A.B. Talochkin, E.N. Vandyshev, A.G. Cherkov, Andrzej Misiuk |
p39 |
|
Use of the Nitride to Reduce High-K Secondary Effects in Submicron MOSFETs
Y. Amhouche, K. Rais |
p45 |
|
Laser Assisted Formation on Nanocrystals in Plasma-Chemical Deposited SiNx Films
Sofia A. Arzhannikova, M.D. Efremov, V.A. Volodin, G.N. Kamaev, D.V. Marin, S.A. Soldatenkov, V.S. Shevchuk, S.A. Kochubei, A.A. Popov, Yu. A. Minakov |
p53 |
|
Stability of Emission Properties of Silicon Nanostructures
M. Baran, L. Khomenkova, N. Korsunska, T. Stara, Moissei K. Sheinkman, V. Yukhymchuk, V. Khomenkov, Y. Goldstein, J. Jedrzejewski, E. Savir |
p59 |
|
Blue Photoluminescence from Quantum Size Silicon Nanopowder
M.D. Efremov, V.A. Volodin, D.V. Marin, Sofia A. Arzhannikova, M.G. Ivanov, S.V. Gorajnov, A.I. Korchagin, V.V. Cherepkov, A.V. Lavrukhin, S.N. Fadeev, R.A. Salimov, S.P. Bardakhanov |
p65 |
