Classification of Defects on Semiconductor Wafers Using Priority Rules
N.G. Shankar, Z.W. Zhong, N. Ravi |
p135 |
|
Grown-In Lattice Defects and Diffusion in Czochralski-Grown Germanium
Jan Vanhellemont, Olivier De Gryse, Steven Hens, Piet Vanmeerbeek, Dirk Poelman, Paul Clauws, Eddy Simoen, C. Claeys, Igor Romandic, Antoon Theuwis, G. Raskin, H. Vercammen, P. Mijlemans |
p149 |
|
Mechanism of Formation and Physical Classification of the Grown-In Microdefects in Semiconductor Silicon
V.I. Talanin, I.E. Talanin |
p177 |
|
Nitrogen in Silicon
De Ren Yang, Xuegong Yu |
p199 |
|
Modelling of Staebler-Wronski Effect in Hydrogenated Amorphous Silicon under Moderate and Intense Illumination
A.F. Meftah, A.M. Meftah, A. Merazga |
p221 |
|
Defect Engineering in Impurity-Free Disordered (Al)GaAs for Optoelectronic Devices Application
Prakash N.K. Deenapanray |
p233 |
