Characterization of the Defect Structure in Molecular Organic Crystals Using Ultrasonic Measurements
R.A. Pethrick
|
p1 |
Theoretical Description of RED: From Dynamics of Defects to Rules for Phase Formation
P.C.T. D'Ajello
|
p14 |
Point Defect Behaviour Resulting from Dopant Diffusions in Silicon
Takahisa Okino
|
p48 |
Defects Below Mask Edges in Silicon Induced by Amorphizing Implantations
Hans Cerva
|
p103 |
Transmission Electron Microscopy Study of the Microstructure of a GaN Film Grown on Sapphire by Organometallic Vapor Phase Expitaxy
D.P. Yu, L.S. Chen, G.Y. Zhang, Y.Z. Tong, Z.J. Yang, S.X. Jin, L.P. You, Zhan Qiang Liu, Z. Zhang
|
p122 |
Acceptor Impurities in Silicion Carbide: Electron Paramagnetic Resonance and Optically Detected Magnetic Resonance Studies
P.G. Baranov
|
p129 |
Hydrogen Diffusion Coefficient Dependencies on Hydrogen Contents in PdAg Alloys
Frederick A. Lewis, X.Q. Tong, R.V. Bucur, K. Kandasamy
|
p161 |
Effect of Crystal Defects in FeNiC Alloys on Subsequent Martensitic Transformation
Xiao Yan Song, Nanju Gu, Hong Peng
|
p165 |