Physical Properties of Boron-Nitride and Carbon-Nitride Films Deposited by Sputtering
G. Fusco, Fabrizio Giorgis, C. Fabrizio Pirri, Alberto Tagliaferro, Elena Tresso, C. De Martino, P. Rava |
p3 |
|
New Applications of Porous Silicon
G. Amato, N. Brunetto |
p15 |
|
Analysis of Defects in Metals, Semiconductors and Photoconducting Insulators through Current Noise Measurements
Anna Carbone, P. Mazzetti |
p25 |
|
Raman Spectroscopy on Amorphous Silicon Based Alloys
Fabrizio Giorgis |
p33 |
|
Modelling of Superalinearity and Thermal Quenching of Photoconductivity in Amorphous Silicon
E. Morgado |
p39 |
|
Diffusion in Metallic Glasses under Non-Equilibrium Conditions
V. Rosato, Marco Vittori Antisari |
p47 |
|
Electronic Structure and Energy of the Defect-Impurity Complexes in Intermetallic Compund TiAl
Cheng Yong Wang, S.Y. Liu, L.G. Han |
p73 |
|
Defect Structures in Spinel Ferrites
Emillia Wolska |
p89 |
