| ISBN / ISBN-13: | 3-908450-83-7 / 978-3-908450-83-2 |
|---|---|
| Year: | 2003 |
| Title: | Defects and Diffusion in Semiconductors [online] |
| Subtitle: | An Annual Retrospective VI |
| Authors/Editors: | D.J. Fisher |
| Published in: | Defect and Diffusion Forum, Volumes 221 - 223 |
| Category: | |
| Pages: | 458 |
| Edition: | softcover |
| Description: | This volume of the annual series contains nearly 800 selected abstracts of recent research in the semiconductor field: dating up to about September 2003 (depending upon individual source publication dates). The succinct abstracts, selected firstly for their experimental results, are supplemented by nearly 150 pages of reviews of research and reports of new experimental work. The latter, mostly invited, papers cover the topics of: Stable Hydrogen Pairs Trapped at C Impurities in Si, a new approach to Capacitance Studies of DX Centers, Diodes Fabricated by means of the Super-Diffusion Technique at Room Temperature, the Modeling of Dopant and Defect Interactions using Si Process Simulators, a spectroscopic study of Mg-Related Impurities in Si, the intriguing technique of Makyoh Topography, the electron diffraction behaviour of 3-D Defects in Nanostructural II-VI Semiconductors, a finite-difference calculation of Impurity Migration in Semiconductors via the Kick-Out Mechanism, the In-Diffusion Concentration Profiles of Dopants in Semiconductors, recent advances in the Measurement of Interstitial O in Si by Infra-Red Spectroscopy and the application of Algorithm Animation to the Super-Diffusion of Non-Equilibrium in Semiconductors. The up-to-date abstract coverage and timely papers will again make this issue essential reading for those wishing to keep abreast of the state-of-the-art in academic semiconductors research. |
| TOC: | Table of Contents |
| Prices: | USD: 370.00 / EUR: 268.00 |
