Deep Level Characterization and its Passivation in 3C-SiC Monitored by Capacitance Transient Methods
Masashi Kato, Masaya Ichimura, Eisuke Arai, Yutaka Tokuda |
p1 |
|
The Formation of p-Type ZnO Films by Using a Diffusion Process
Min Chang Jeong, D.K. Hwang, Jae Min Myoung, Y.D. Ko, M.S. Kim, I. Yun |
p17 |
|
The Role of Dislocations in the Plastic Behavior of Silicon Nitride A Review
X. Milhet, Jean Luc Demenet, Jacques Rabier |
p23 |
|
Structural Defects in Amorphous Silicon Oxynitride and Silicon Nitride
H. Kato, Y. Ohki |
p39 |
|
Sintering Characteristics of Nano-Ceramic Coatings
Jeff Th.M. de Hosson, R. Popma |
p51 |
|
Ab Initio Modelling of Metal Adhesion to Ceramics with Surface Defects
E.A. Kotomin, Y.F. Zhukovskii |
p67 |
|
The Effective Diffusivity in Two-Phase Material
Irina V. Belova, Graeme E. Murch |
p79 |
