Thick GaN Films Grown on Sapphire: Defects in Highly Mismatched Systems
T. Paskova, E. Valcheva, Bo Monemar |
p1 |
|
Novel Defect-Related Properties of Silicon
S.M. Prokes, R.C. Cammarata |
p29 |
|
The Search for Tunnelling States in Bulk Silicon Disordered by Fast Neutron Irradiation
Michèle Coeck, Christiane Laermans |
p47 |
|
Residual Shallow Donor- and Acceptor-Impurities in SSD- and LEC-Grown High-Purity InP Crystals
E. Kubota, S. Yamada, Kotoji Ando |
p67 |
|
Dislocations in Semiconductors: Core Structure and Mobility
João F. Justo |
p97 |
|
Analysis of Radiation-Induced Defects in InGaP Materials and Solar Cells
Aurangzeb Khan |
p107 |
|
A Perspective from Crystal Growth and Wafer Processing on the Properties of Intrinsic Point Defects in Silicon
Robert J. Falster, Vladimir V. Voronkov |
p125 |
|
Copper Complexes in Silicon Crystals
Minoru Nakamura |
p135 |
|
The Effect of Implant Temperature and Pre-Annealing on Defect Formation after Laser Thermal Processing
H.B. Banisaukas, Kevin S. Jones, S. Talwar, D.C. Jacobson |
p145 |
|
X-Ray Topographic Analysis of Misfit Dislocation Distribution in InGaAs and GeSi/Si Partially Relaxed Heterostructures
C. Ferrari |
p153 |
