Atomic Structure and Properties of Extended Defects in Silicon
M.F. Chisholm, Ryszard Buczko, M. Mostoller, T. Kaplan, A. Maiti, Sokrates T. Pantelides, S.J. Pennycook |
p3 |
|
Electrical Activity of Tilt and Twist Grain Boundaries in Silicon
A.K. Fedotov, A.V. Mazanik, E.A. Katz, Yu. Ilyashuk, A. Drozdovski, L.E. Polyak |
p15 |
|
Computer Simulation of Impurity Diffusion in the Vicinity of Grain Boundaries
A.K. Fedotov, M. Chuiko, A.V. Mazanik |
p21 |
|
Impurity Effect on the Dislocation DLTS Spectrum in Silicon
Olga V. Feklisova, G. Mariani-Regula, Bernard Pichaud, Eugene B. Yakimov |
p27 |
|
Formation and Annihilation of New Donors in Ribbon Growth on Substrate Silicon
D. Karg, Axel Voigt, J. Krinke, C. Häßler, H.-U. Höfs, Gerhard Pensl, M. Schulz, Horst P. Strunk |
p33 |
|
Electrical Properties of Oxygen Precipitates Formed During Two Step Low Temperature Annealing
Eugene B. Yakimov, Olga V. Feklisova, Maurizio Acciarri, Anna Cavallini, Sergio Pizzini |
p39 |
|
Grain Boundary Effects in Ionic and Mixed Conductors
Joachim Maier |
p45 |
|
Qualitative and Quantitative Analysis of Thin Film Heterostructures by Electron Beam Induced Current
R. Scheer |
p57 |
|
Laser Beam Induced Current Characterization of High Efficiency Chalcopyrite Solar Cells
G.A. Medvedkin, J. Wennerberg |
p69 |
|
Effective Diffusion Length of Multicrystalline Solar Cells
C. Donolato |
p75 |
