Charge Collection Scanning Microscopy: Non-Conventional Applications
Antonio Castaldini, Anna Cavallini |
p1 |
|
EBIC Study of Field Effect Transistors on Modulation-Doped AlGaAs/lnGaAs/GaAs Heterostructures
B. Sieber, J.-L. Farvacque |
p13 |
|
EBIC of Strained Si/SiGe 2DEGs Showing Lateral Electron Confinement
Carl E. Norman, N. Griffin, D.D. Arnone, D.J. Paul, M. Pepper, B. Gallas, J.M. Fernández |
p25 |
|
Laser Induced Mapping for Separation of Bulk and Surface Recombination
H.-C. Ostendorf, A.L. Endrös |
p33 |
|
Analysis of Minority Carrier Diffusion in the Presence of a Dislocation Array: Effective Diffusion Length, Luminescence Efficiency and Dark Current
C. Donolato |
p45 |
|
Detection and Characterisation of 'Sleeping' Defects in Silicon by LBIC Scan Maps at 80 K.
Santo Martinuzzi, Isabelle Périchaud, Scott A. McHugo |
p53 |
|
Combined MOS/EBIC and Tem Study of Electrically Active Defects in SOI Wafers
O.V. Kononchuk, I.E. Bondarenko, George A. Rozgonyi |
p61 |
|
Characterization of Laser Structures by EBIC Measurements and Simulation
I. Rechenberg, H. Wenzel, A. Knauer, G. Beister |
p69 |
|
Evaluation of p-n Junction Position and Channel Length in Si Devices with Resolution of a Few Nanometers by Low-Energy EBIC
Martin Kittler, J. Lärz |
p77 |
|
Monte Carlo Simulation of the Recombination Contrast of Dislocations
N. Tabet |
p89 |
