Defect Distribution on Epilayer/Sustrate Interfaces of ISOVPE-MCT Films
U. Gilabert, A.B. Trigubó, R. González, N.E. Walsöe de Reca |
p1 |
|
Defects in Implanted Hg1-xCdxTe: Electrical and Structural Characterization
M.H. Aguirre, H. Cánepa, E. Heredia, N.E. Walsöe de Reca |
p21 |
|
Dislocations in GaAs: Their Impact on Electronic and Atomic Processes
T. Wosiński, T. Figielski |
p27 |
|
Electronic Structures of Dangling-Bond Structures Fabricated on Hydrogen-Terminated Si(100)-2 x 1 Surfaces
T. Hitosugi, T. Hashizume, S. Heike, H. Kajiyama, Y. Wada, S. Watanabe, T. Hasegawa, Koichi Kitazawa |
p43 |
|
Recent Progress in the Understanding of Surface Diffusion: Influence of Phase Transitions and Surface Heterogeneities
F. Nieto, A. Tarasenko, C. Uebing |
p59 |
|
Some Non-Fickian Diffusion Equations: Theory and Applications
Amal K. Das |
p97 |
|
Comment on 'Dopant Migration Caused by Point Defect Gradients' [P.Pichler, S. List: Solid State Phenomena, 32-33 (1993) 259]
K. Maser |
p119 |
