A New Method for Grain Boundary Diffusion Coefficient Measurement
René Le Gall, Guy Saindrenan, D. Roptin |
p85 |
|
Complex Atomic-Scale Dynamics in Grain Boundaries in Silicon
Sokrates T. Pantelides, A. Maiti, M.F. Chisholm, S.J. Pennycook |
p95 |
|
Relation Between Segregation at Interfaces, Structure and Diffusion in Germanium
A. Charaї, Andree Rolland, F. Cabané |
p97 |
|
Microscopic Investigation of Surface Segregation in Random Alloys
A.Yu. Lozovoi, P.A. Korzhavyi, Yu.Kh. Vekilov |
p107 |
|
Segregation, Phase Separation and Grain Boundary Diffusion in Thin Films
C. Cserháti, D.L. Beke, I.A. Szabó |
p121 |
|
AES Study of the Mass Transport of Nickel Near Ni / Cu (111) Interface
Zs. Tôkei, D.L. Beke, Jean Bernardini, Andree Rolland |
p129 |
|
Grain Boundary Segregation in the Cu-Bi System
L.S. Chang, Eugen Rabkin, Boris B. Straumal, S. Hofmann, B. Baretzky, W. Gust |
p135 |
|
Grain Boundary Electromigration in Thin Films: Interface Reaction and Segregation Effects
Evgeny E. Glickman |
p147 |
|
Grain Boundary Diffusion, Electromigration and Segregation in Cu and Cu-2wt% Sn Alloy
D. Gupta |
p161 |
|
The Effect of Pressure on Grain Boundary Wetting, Segregation and Diffusion
Witold Łojkowski, Eugen Rabkin, Boris B. Straumal, Lasar S. Shvindlerman, W. Gust |
p163 |
