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Title

Band Tailings and Deep Defects in Semiconductors

ISBN / ISBN-13: 3-908450-18-7 / 978-3-908450-18-4
Year: 1996
Title: Band Tailings and Deep Defects in Semiconductors   [online]
Authors/Editors: A.A. Teate and N.C. Halder
Published in: Defect and Diffusion Forum, Volume 133
Category:
Pages: 156
Edition: softcover
Description: The present textbook treats the effects of temperature upon weakly disordered hydrogenated amorphous silicon and hydrogenated amorphous germanium, as well as the effect of weak disorder upon more complex systems such as GaAs and Al2Gal-xAs alloy. The effects of disorder-induced band tailing upon deep levels in compound semiconductor alloys are also studied.
The results indicate that standard experimental measurements of DLTS, without appropriate corrections, usually underestimate the activation energy, capture cross-section, etc.; even in the case of weak disorder.

TOC: Table of Contents
Prices: USD: 136.00 / EUR: 99.00

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(ISBN: 978-3-908450-18-4)
(ISBN: 978-3-908450-18-4)