Laser Scattering Measurement of Microdefects on Silicon Oxide Wafer
Taeho Ha, Takashi Miyoshi, Yasuhiro Takaya, S. Takahashi |
p3 |
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Characterisation of Surface Properties by a Multi-Function TPM
Xian Ping Liu, J. Zhang |
p9 |
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Development of an Evanescent Light Measurement System for Si Wafer Microdefect Detection
S. Takahashi, R. Nakajima, Takashi Miyoshi, Yasuhiro Takaya, Kiyoshi Takamasu |
p15 |
|
An Embedded FBG Sensor for Dynamic Strain Measurement for a Clamped-Clamped Composite Structure
Hang Yin Ling, Alan Kin Tak Lau, Li Cheng, J. Wei, R.S. Thomson, M.L. Scott |
p21 |
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A Thermovision Method for Studying Deformation Kinetics of Materials and Structure Elements
Evgeny S. Lukin, Alexandr M. Ivanov |
p27 |
|
Damage Detection of Composite Structures Using Dynamic Analysis
L.H. Yam, Li Cheng, Z. Wei, Y.J. Yan |
p33 |
|
Investigation of Nonisothermal Crystallization Behaviors of Poly and Silica Nanocomposites Using Differential Scanning Calorimetry
Ling Xue Kong, Z. Peng |
p39 |
|
Ellipsometric Detection of Transitional Surface Structures on Decapped GaAs(001)
A.V. Vasev, S.I. Chikichev |
p45 |
|
Temperature Effect on the Stability of CuO Nanofluids Based on Measured Particle Distribution
Ho Chang, Chih Hung Lo, Tsing Tshih Tsung, Y.Y. Cho, D.C. Tien, Liang Chia Chen, C.H. Thai |
p51 |
|
Determination of Young's Modulus of Micromechanical Silicon Films Using an Acoustic Excitation and Optical Detection Resonance Method
Y.M. Liu, W.J. Tian, S.J. Zhang |
p57 |
