Accounting for Secondary Extinction in Thickness Measurement of Thin Films by X-Ray Absorption
I. Tomov |
p99 |
|
A PF Measurement Attachment of the Work-Piece for ODF Analysis
Qiu Lin Wu, Xiaojun Hu, Kemao Lv, Shu Bo Liu, Zuming Fu, Xiaomin Sun, Jian Min Wang, Limin Li |
p105 |
|
Quantitative Texture Measurements Using Neutron Time-Of-Flight Diffraction
Sven C. Vogel, Ch. Hartig, R.B. Von Dreele, H.R. Wenk, D.J. Williams |
p107 |
|
Quantitative Texture Analysis with the HIPPO TOF Diffractometer
J. Pehl, Siegfried Matthies, H.R. Wenk, Luca Lutterotti, Sven C. Vogel |
p113 |
|
Effect of Strong Neutron Absorption on Texture and Diffraction Data Analysis
Heather M. Volz, Sven C. Vogel, J.A. Roberts, A.C. Lawson, D.J. Williams, L.L. Daemen |
p119 |
|
In Situ High Temperature Texture Characterisation in NiTi Shape Memory Alloy Using Synchrotron Radiation
Andersan S. Paula, Karimbi K. Mahesh, Francisco Manuel Braz Fernandes, Rui Miguel S. Martins, A.M.A. Cardoso, Norbert Schell |
p125 |
|
Texture Determination of Thin Cu-Wires by Synchrotron Radiation
Heinz Günter Brokmeier, Brigitte Weiss, Sang Bong Yi, Wenhai Ye Yi, Klaus Dieter Liss, Thomas Lippmann |
p131 |
|
Measurement of High-Resolution Recrystallization Textures in Nickel Sheets Using High-Energy Synchrotron Radiation
Helmut Klein, Andrea Preusser, Lars Raue, Hans Joachim Bunge |
p137 |
|
Determination of Multipeak Textures with High-Energy Synchrotron Radiation
Andrea Preusser, Helmut Klein, Lars Raue, Hans Joachim Bunge |
p143 |
|
Quantification of Texture Inhomogeneity
Jan T. Bonarski |
p149 |
