Residual Strain Measurement by Synchrotron Diffraction
Philip J. Withers, Michael Preuss, P.J. Webster, D.J. Hughes, Alexander M. Korsunsky |
p1 |
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Problems Related to Energy-Dispersive X-Ray Stress Analysis Performed in Reflection Geometry
Carsten Stock, Christoph Genzel, Walter Reimers |
p13 |
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Global X-Ray Method for the Determination of Stress Profiles
Jean Michel Sprauel, H. Michaud |
p19 |
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The Influence of Surface Roughness on the Refraction Correction of Bragg Peak Positions
Michael Ott, Detlef Löhe |
p25 |
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Application of Non-linear Sin2ψ Method for Stress Determination Using X-Ray Diffraction
A. Baczmański, R.J. Lark, S.J. Skrzypek |
p29 |
|
Assumptions in Thin Film Residual Stress Methods
Arnold C. Vermeulen |
p35 |
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Residual Stresses Near Holes in Tempered Glass Plates
Laurent Daudeville, Frédéric Bernard, René Gy |
p43 |
|
Residual Stresses in Bulk Metallic Glasses – I: Modeling
Cahit Can Aydiner, Ersan Üstündag |
p49 |
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Modelling of the Relaxation Behaviour of Carbide-Hardened Superalloys
U. Martin, H. Oettel, U. Mühle |
p55 |
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Characterization of Machining Distortion by Strain Energy Density and Stress Range
R.W. Schultz, M.E. Karabin |
p61 |
