Ion Beam Induced Epitaxial Crystallization of Buried SiC Layers in Silicon
J.K.N. Lindner, K. Volz, B. Stritzker
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p73 |
Ion Beam Induced Epitaxial Regrowth and Interfacial Amorphization of Compound Semiconductors
E. Glaser, T. Fehlhaber, Robert Schulz, T. Bachmann
|
p79 |
Effects of Ion Irradiation on Ferromagnetic Thin Films
J.E.E. Baglin, M.H. Tabacniks, R. Fontana, A.J. Kellock, T.T. Bardin
|
p87 |
Special Surface Structures in Surface Alloy Growth
D.J. O'Connor, J. Yao, Yao Gen Shen
|
p95 |
Charge Carrier Lifetime Modificaiton in Silicon by High Energy H+, He+ Ion Implantation
N.Q. Khánh, P. Tüttö, E.N. Jároli, O. Buiu, L.P. Biró, F. Pászti, T. Mohácsy, C. Kovacsics, A. Manuaba, J. Gyulai
|
p101 |
Range Parameters of Aluminium Implanted Targets
M. Hayes, E. Friedland, T. Hauser
|
p107 |
Identifitcation of Bandgap States in Semiconductors by Transmutation of Implanted Radioactive Tracers
N. Achtziger
|
p113 |
Hall Effect Measurements on Transmutation Doped Semiconductors
G. Rohrlack, Kristian Freitag, Ch. von Nathusius, R. Vianden, Russell Gwilliam, Brian J. Sealy
|
p119 |
Characterization of Cu/Al2O3 Interfaces after Heavy Ion Irradiation
K. Neubeck, M. Rodewald, R. Riemenschneider, D.M. Rück, H. Baumann, Horst Hahn, Adam G. Balogh
|
p125 |
In-Depth Characterization of Damage Produced by Swift Heavy Ion Irradiation Using a Tapping Mode Atomic Force Microscope
L.P. Biró, J. Gyulai, K. Havancsák
|
p129 |