A New Possibility for Powder Diffraction: The Characterization of the Domain Microstructure in a Ferroelectric Material
C. Valot, N. Floquet, M.T. Mesnier, J.C. Niepce |
p59 |
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X-Ray and Neutron Analysis of the Dislocation Content in Plastically Deformed β-Brass
D. Breuer, P. Klimanek |
p67 |
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The Cross Correlation Method: A Useful Tool for Peak Shift Determination in XSE
V.R. Vosberg, W. Fischer, W.Joe Quadakkers |
p73 |
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Empirical Texture Correction for Different Diffraction Geometrics: Experimental Tests
R. Cerný, V. Valvoda |
p77 |
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New Opportunities in the Texture and Stress Field by the Whole Pattern Analysis
Maurizio Ferrari, Luca Lutterotti, Siegfried Matthies, P. Polonioli, H.R. Wenk |
p83 |
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Analysis of Peak Shapes in X-Ray Diffractometry (GUINIER Geometry) of Standard Materials Using Asymmetric Profile Functions
A.M. Schneider, W. Paszkowicz, P. Behrens, J. Felsche |
p89 |
|
Diffraction Anomalous Fine Structure Analysis on (Bi,Pb)2PtO4 Powders
J. Vacinova, J.-L. Hodeau, P. Bordet, M. Anne, D.E. Cox, A. Finch, P. Pattison, W. Schweggle, H. Graafsma, Å. Kvick |
p95 |
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Rapid Polymer Identification with X-Ray Diffraction
S. Haaga, W. Engel, M. Tietz, H.-J. Radusch |
p101 |
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An Improved X-Ray Image Plate Detector for Diffractometry
M. Thoms, H. Burzlaff, A. Kinne, J. Lange, H. von Seggern, R. Spengler, Albrecht Winnacker |
p107 |
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Refinement of Powder Diffraction Data Collected Using Imaging Plates
D.J. Cookson, G.J. Foran, B.A. Hunter, Ismunandar, Brendan J. Kennedy |
p113 |
