Generalization of Empirical Texture Correction and Application to Joint Refinement
R. Cerný, V. Valvoda, M. Chládek |
p97 |
|
Correction of the Microabsorption Effect in Rietveld Analysis
W. Pitschke, N. Mattern, H.U. Hermann |
p103 |
|
Degree of Crystallinity Calculations for Polymer and Catalyst Materials
S. Justi, E.S. Sherman, M. Olariu |
p109 |
|
Angle-Dispersive Powder-Diffraction at High Pressure
M.I. McMahon, R.J. Nelmes |
p117 |
|
An Overview of NIST Powder Diffraction Standard Reference Materials
James P. Cline |
p127 |
|
Experimental Whole Powder Pattern Intensity Calibration in X-Ray Powder Diffractometry (XRPD)
A. Kern, W. Eysel |
p135 |
|
Grazing Incidence Diffraction with a Sealed Tube X-Ray Source
P. Van der Sluis |
p141 |
|
Phase Transformation of NiTi Alloy Studied with an Inel X-Ray Position Sensitive Detector
Henryk Morawiec, Tomasz Goryczka, Artur Chrobak |
p147 |
|
Use of an X-Ray Imaging Plate for Stress Analysis
A. Schubert, B. Kämpfe, M. Ermrich, E. Auerswald, K. Tränkner |
p151 |
|
Use of an X-Ray Imaging Plate for Texture Measurements
Heinz Günter Brokmeier, M. Ermrich |
p157 |
