X-Ray Method for Continuous Tracking of Grain Boundary Motion: Investigation of Grain Boundary Migration in Al-Bicrystals
U. Czubayko, Dmitri A. Molodov, B.-C. Petersen, Günter Gottstein, Lasar S. Shvindlerman |
p125 |
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A High-Pressure Device for In-Situ Measurements in a Neutron Beam
J. Heinitz, N.N. Isakov, A.N. Nikitin, W.A. Sukhoparov, K. Ullemeyer, Kurt Walther |
p131 |
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Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM): Further Hardware Development to Improve Pattern Quality
Jarle Hjelen, A.H. Qvale, Ø. Gomo |
p137 |
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A High Resolution Electron Diffraction Method for On-Line Texture Analysis
R. Høier, J. Bentdal, O. Daaland, Erik Nes |
p143 |
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Automatic Recognition of Deformed and Recrystallized Regions in Partly Recrystallized Samples Using Electron Back Scattering Patterns
N.C. Krieger Lassen, Dorte Juul Jensen, K. Condradsen |
p149 |
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Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements
B. Moreau, Francis Wagner, H. Göbel |
p159 |
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Determination of Texture in CuZnAl Shape Memory Alloys in the High Temperature Austenitic Phase
No Jin Park, Hans Joachim Bunge |
p167 |
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Orientation Connectivity in Polycrystals
Valerie Randle |
p175 |
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High Temperature Texture Goniometer for the Measurement of Transformation Textures
F.R. Reher, W. Hänel, U. Czubayko, Günter Gottstein |
p181 |
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A CCD Camera System for the Acquisition of Backscatter Kikuchi Patterns on an SEM
Robert A. Schwarzer |
p187 |
