Background and Bragg Scattering Component Separation in Powders via the XRD Technique
Giovanni Berti |
p83 |
|
Rietveld Refinement employing X-Ray Data on CaWO4 from Different Powder Diffraction Geometries
P.B. Kempa, J. Felsche |
p89 |
|
Stress Measurements in Textured Materials
Paul Van Houtte |
p97 |
|
Interpretation of X-Ray Stress Measurements
B. Kämpfe, F. Krause, L. Skurt |
p111 |
|
X-Ray Analysis of Residual Stresses and Textures in Thin Coatings
A. Schubert, B. Kämpfe, E. Auerswald |
p117 |
|
Oblique-Texture Electron Diffraction in Powder Crystallography
B.B. Zvyagin |
p125 |
|
Texture Investigation by Means of Model Functions
T. Eschner |
p139 |
|
Estimation of the Texture Component Parameters in Cubic Metals
J. Jura |
p145 |
|
Application of the ADC Method for ODF Approximation in Cases of Low Crystal and Sample Symmetries
K. Pawlik |
p151 |
|
XRD Texture Investigations with the Employment of Location Sensitive Measuring Technique
L. Wcislak, Hans Joachim Bunge, C. Nauer-Gerhardt |
p157 |
