Impact of Defects on the Technology of Highly Integrated Circuits
Bernd O. Kolbesen, Werner Bergholz, H. Wendt |
p1 |
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Defects and Future Semiconductor Devices
D.V. Lang |
p13 |
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Configurations and Properties of Hydrogen in Crystalline Semiconductors
S.J. Pearton, Michael Stavola, James W. Corbett |
p25 |
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Defect Metastability and Bistability
G.D. Watkins |
p39 |
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The EL2 Defect in GaAs
Jaroslaw Dąbrowski, Matthias Scheffler |
p51 |
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Magneto-Optical and ODMR Investigations on Intrinsic and Extrinsic Defects in GaAs
B.K. Meyer |
p59 |
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Defects Induced by Reactive Ion Etching (RIE) in GaAs and Correlation with EL2
Toshiyuki Ikoma, Yukito Hagihara |
p67 |
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ESR-Spectra of Defects in Plastically Deformed GaAs
M. Wattenbach, Joachim Krüger, Christian Kisielowski-Kemmerich, H. Alexander |
p73 |
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The Temperature Dependence of the Hole Ionization Cross Section of EL2 in GaAs
P. Omling, P. Silverberg, L. Samuelson |
p79 |
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Metastable to Stable EL2 Regeneration via an 'Auger' Mechanism Induced by the Debye Tail
X. Boddaert, D. Stiévenard, Michel Lannoo, Pierre Boher |
p85 |
