High Resolution Transmission Electron Microscopy of Grain Boundaries
William Krakow |
p151 |
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Tunneling Microscopy of Surface Diffusion
J.E. Griffith, J.A. Kubby |
p167 |
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Characterization of Interfacial Chemistry by Analytical Electron Microscopy
A.D. Romig, Jr. |
p179 |
|
Solute Interactions in Metals
S.M. Myers |
p197 |
|
Oxygen Diffusion in High Tc-Superconductors
Jules L. Routbort, Steven J. Rothman, Brian K. Flandermeyer, Lubomir J. Nowicki, Judith E. Baker |
p213 |
|
Tracer Diffusion of 60Co and 63Ni in Amorphous NiZr Alloy
K. Hoshino, Robert S. Averback, H.Thomas Hahn, Steven J. Rothman |
p225 |
|
Tracer Diffusion in Pure and Boron-Doped Ni3Al
K. Hoshino, Steven J. Rothman, Robert S. Averback |
p233 |
|
The Behavior of Transition Metals in Silicon during Annealing Transients
D.R. Sparks, N.S. Alvi, Mysore A. Dayananda |
p239 |
|
Suppression of Vacancy Diffusion during Short Range Ordering
B. Fultz, L. Anthony |
p253 |
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Crystallization and Diffusion Studies in Amorphous Ni-Zr Thin Films
G.V. Chandrashekhar, D. Gupta, S.B. Newcomb, F.M.H. Spit, K.N. Tu |
p261 |
