Residual Stresses VII, ECRS7 (Table of Contents)

The Importance of Residual Stresses in Microelectronic Products and Materials Wolfgang H. Müller	p1
An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth A. Kumar, U. Welzel, M. Wohlschlögel, W. Baumann, Eric J. Mittemeijer	p13
Mechanical Stress Gradients in Thin Films Analyzed Employing X-Ray Diffraction Measurements at Constant Penetration/Information Depths M. Wohlschlögel, W. Baumann, U. Welzel, Eric J. Mittemeijer	p19
Sub-Surface Residual Stress Gradients: Advances in Laboratory XRD Methods Cristy Leonor Azanza Ricardo, Mirco D'Incau, Paolo Scardi	p25
Determination of Real Space Residual Stress Distributions σ_ij(z) of Surface Treated Materials with Diffraction Methods Part I: Angle-Dispersive Approach Thorsten Manns, Jens Gibmeier, Berthold Scholtes	p31
Determination of Real Space Residual Stress Distributions σ_ij(z) of Surface Treated Materials with Diffraction Methods Part II: Energy Dispersive Approach Ingwer A. Denks, Manuela Klaus, Christoph Genzel	p37
The Residual Stresses Generated by Deep Rolling and their Stability in Fatigue & Application to Deep-Rolled Crankshafts H. Michaud, Jean Michel Sprauel, F. Galzy	p45
Stability of Residual Stresses of Deep Rolled Sintered Iron at Quasistatic and Cyclic Loading Jens Merkel, Volker Schulze, Alexander Wanner, Otmar Vöhringer	p51
Residual Stress Stability in High Temperature Fatigued Mechanically Surface Treated Metallic Materials I. Altenberger, Ivan Nikitin, P. Juijerm, Berthold Scholtes	p57
Residual Stresses Induced by Cross-Rolling Krzysztof Wierzbanowski, S. Wroński, Andrzej Baczmański, Mirosław Wróbel, Chedly Braham, Michael E. Fitzpatrick, Alain Lodini	p63

Papers of Title

Residual Stresses VII, ECRS7

Table of Contents (151 papers, 10 per page listed)