Engineering Nanotechnology: The Top Down Approach
Robert J. Hocken, R. Fesperman, J. Overcash, O. Ozturk, C. Stroup |
p3 |
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Dimensional Measurements for Micro- and Nanotechnology
Gao Liang Dai, F. Pohlenz, H.U. Danzebrink, L. Koenders |
p7 |
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Recent Advances in our Research on Ultrahigh Resolution Laser Confocal Microscopy
Jiu Bin Tan, Jian Liu |
p11 |
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Reliable Detection of Periodic Micro Structures on Open Surfaces
Frank Härtig, Michael Paul Krystek, S. Klein |
p15 |
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The Assessment of Functional Properties of Surfaces with Morphological Operations
Michael Dietzsch, S. Gröger, M. Gerlach, Michael Paul Krystek |
p19 |
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Tactile and Optical Microsensors - Test Procedures and Standards
Ulrich Neuschaefer-Rube, Michael Neugebauer, W. Ehrig, Markus Bartscher, U. Hilpert |
p23 |
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Simulation of Light Scattering from Nanostructured Surfaces
Andreas Tausendfreund, S. Patzelt, S. Simon, G. Goch |
p27 |
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Characterization and Manipulation of Boron Nanowire inside SEM
Ming Chang, C.H. Lin, Juti Rani Deka |
p31 |
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AFM with the Slope Compensation Technique for High-Speed Precision Measurement of Micro-Structured Surfaces
Yu Guo Cui, Bing Feng Ju, J. Aoki, Yoshikazu Arai, Wei Gao |
p35 |
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Compact Displacement Measurement System Based on Microchip Nd:YAG Laser with Birefringence External Cavity
Y. Tan, S. Zhang |
p39 |
