Nanocrystal Non-Volatile Memory Devices
Zs.J. Horváth, P. Basa |
p1 |
|
On Similar Electrical, Optical and Structural Properties of MOS Structures Prepared on a-Si:H/c-Si, Porous Silicon/c-Si, and c-Si
Emil Pinčík, Hikaru Kobayashi, Róbert Brunner, Masao Takahashi, Jaroslav Rusnák, Matej Jergel |
p11 |
|
Sm1-xNdxNiO3 Thin Films Deposition by KrF Laser Ablation
Slimane Lafane, Tahar Kerdja, Samira Abdelli-Messaci, S. Malek, M. Maaza |
p27 |
|
Problems with Synthesis of Chalcopyrite CuIn1-xBxSe2
J. Olejníček, S.A. Darveau, C.L. Exstrom, Rodney J. Soukup, Ned J. Ianno, C.A. Kamler, James Huguenin-Love |
p33 |
|
Phase Explosion in Silicon and Titanium Targets Irradiated by Third Harmonic Nd-YAG Pulsed Laser
Tahar Kerdja, K. Yahiaoui, A. Bendib, S. Malek |
p37 |
|
Optical Properties of the Strained Layer Superlattices (GaAs)6/(GaP)m(001) (m=2, 4 and 6)
Ali Hamidani, B. Bennecer |
p41 |
|
Characterization of a-C:H Thin Films Deposited from C2H4 by PECVD Microwave Discharge
M. Kihel, R. Clergeraux, Salah Sahli, D. Escaich, Y. Segui, Patrice Raynaud |
p49 |
|
Thin Layered Structures Analysis Using NUR Reflectometer
M. Izerrouken |
p53 |
|
Characterization of SiOF Thin Films Deposited by PECVD from Hexamethyldisiloxane in Mixture with Oxygen and CF4
R. Chabane, Salah Sahli, A. Zenasni, Patrice Raynaud, Y. Segui |
p59 |
|
Cyclohexyl Methacrylate with Tetra (Ethylene Glycol) Dimethacrylate in Tertahydrofuran Radical Copolymerization
Asmahane Fasla, Seghier Ould Kada, Zoubida Seghier, Alain Périchaud |
p63 |
